ABOUT
Overview
Nanostructural analysis department management system chart
Implementation system (University of Tokyo Hub)
- president
-
Teruo Fujii Head of implementing agency
- Dean of the School of Engineering
-
Yasuhiro Kato
- Director of General Research Organization
-
Naoya Shibata
- Director of Nanotechnology Research Center
-
Yuichi Ikuhara (Representative)
- Steering Committee (problem selection and review)
-
Yuichi Ikuhara 教授Hiroyuki Takahashi 教授Naoya Shibata 教授Kenjiro Taura 教授Junichiro Shiomi 教授Yoshiro Mita 教授
- General coordination room
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Yukinori OchiaiKazuhiko MoriyamaKazue Inoue
Fine Structural Analysis Division
general manager
Yuichi Ikuhara
Professor (Engineering)
- Coordination room
-
leader Naoya Shibata Professor (Engineering)Manager Kazuhiko Moriyama
⑥ Material data analysis team
Yasushi Shimoda
Professor (Engineering)
Microfabrication department
general manager
Hiroyuki Takahashi
Professor (Engineering)
Data infrastructure department
general manager
Kenjiro Taura
Professor (affair)
Equipment group of microstructure analysis department
Inorganic Materials Atomic Structure Measurement Division
- Low acceleration voltage compatible atomic resolution scanning transmission electron microscope JEM-ARM200F NeoARM (JEOL) TEM/STEM
- High contrast transmission analytical electron microscope JEM-2010HC (JEOL) TEM/STEM
- Environmentally friendly ultra-high resolution electron microscope JEM-ARM200F Cold dual (JEOL) TEM/STEM
- Transmission/scanning analytical electron microscope JEM-2800 SDD (JEOL) TEM/STEM
- Atomic resolution elemental mapping structure analyzer JEM-ARM200F SDD (JEOL) TEM/STEM
- Ultra-high resolution transmission electron microscope JEM-ARM200F (JEOL) TEM/STEM
- Ultra-high resolution scanning transmission electron microscope for light elements JEM-ARM200F Cold SDD (JEOL) TEM/STEM
- High resolution analytical electron microscope JEM-2010F (JEOL) TEM/STEM
- High-resolution top-entry transmission electron microscope JEM-2000EX (JEOL) TEM/STEM
- Focused ion/electron beam combined beam processing and observation device JIB-PS500i (JEOL) FIB
- 3D functional fusion device linked to CAD data Pre-processing system for evaluation XVision200TB (Hitachi High-Tech) FIB
- High-resolution scanning analytical electron microscope JSM-7800F Prime (JEOL) SEM
- High resolution scanning electron microscope JSM-7000F (JEOL) SEM
- Low vacuum scanning electron microscope JSM-6510FA (JEOL) SEM
- Low-damage scanning analytical electron microscope JSM-7500FA (JEOL) SEM
- Cross section polisher SM-090010 (JEOL), SM-090020 (JEOL) TEM SEM sample
- Ion slicer EM-09100IS (JEOL) TEM SEM sample
- Cryion slicer IB-09060CIS (JEOL) TEM SEM sample
- Ultramicrotome UC7 type (Leica) TEM/STEM
Electronic condition measurement department
- Multifunctional scanning X-ray photoelectron spectrometer PHI 5000 VersaProbe (ULVAC-PHI) XPS
- Multifunctional scanning X-ray photoelectron spectrometer XPS with AES (PHI 5000) PHI 5000 VersaProbeⅢ (ULVAC-PHI) XPS
- Spectroscopic ellipsometer M-2000DI-T (JAWoolam) Light, electric, magnetic properties
- Electron spin resonance device ESR JES-FA300 (JEOL) Light, electric, magnetic properties
Low Carbon Materials/Device Physical Properties and Structure Measurement Division
- High brightness in-plane type X-ray diffraction device SmartLab (Rigaku) XRD
- Powder X-ray diffraction device SmartLab (3kW) (Rigaku) XRD
- Powder X-ray diffractometer SmartLab (Kα1) (Rigaku) XRD
- Microcrystal structure analyzer VariMax Dual (Rigaku) XRD
- Electromagnetic property measurement device under extreme environment PPMS-14LHatt (Quantum Design) Light, electric, magnetic properties
- Environmental control manual prober station CRX-4K (Lake Shore) Light, electric, magnetic properties
TEM/STEM
11
SEM
4
FIB
2
XRD
4
XPS
2
SIMS
1
TEM SEM sample
5
Light, electric, magnetic properties
4