FACILITIES
Equipment guide
Shared equipment price list (tax included)
| Facility name | Equipment ID number | unit price | Billing amount (with data provided) | Billing amount (no data provided) | ||||
|---|---|---|---|---|---|---|---|---|
| equipment use | technical assistance | Technical agency | equipment use | technical assistance | Technical agency | |||
| Atomic resolution scanning transmission electron microscope (NEO ARM) with low accelerating voltage | UT-001 | 1 days | 53,000 | 106,000 | 265,000 | 79,500 | 159,000 | 397,500 |
| Scanning transmission electron microscope for light elements JEM-ARM200F ColdFE | UT-002 | 1 days | 32,000 | 64,000 | 160,000 | 48,000 | 96,000 | 240,000 |
| Ultra-high resolution transmission electron microscope JEM-ARM200F ColdFE | UT-003 | 1 days | 25,000 | 50,000 | 125,000 | 37,500 | 75,000 | 187,500 |
| Environmentally friendly ultra-high resolution electron microscope JEM-ARM200F ColdFE (STEM Double SDD) | UT-004 | 1 days | 53,000 | 106,000 | 265,000 | 79,500 | 159,000 | 397,500 |
| Atomic resolution elemental mapping structure analyzer JEM-ARM200F Thermal FE (STEM SDD) | UT-005 | 1 days | 27,000 | 54,000 | 135,000 | 40,500 | 81,000 | 202,500 |
| Multifunctional field emission transmission electron microscope JEM-F200 | UT-012 | 1 days | 21,000 | 42,000 | 105,000 | 31,500 | 63,000 | 157,500 |
| Transmission/scanning analytical electron microscope (TEM/STEM) JEM-2800 | UT-006 | 1 days | 15,000 | 30,000 | 75,000 | 22,500 | 45,000 | 112,500 |
| High resolution analytical electron microscope (JEM-2010F) | UT-007 | 1 days | 12,000 | 24,000 | 60,000 | 18,000 | 36,000 | 90,000 |
| High contrast transmission electron microscope (JEM-2010HC) | UT-009 | 1 days | 3,000 | 6,000 | 15,000 | 4,500 | 9,000 | 22,500 |
| Cryo-transmission electron microscope JEM-2100F | UT-010 | 1 days | 24,000 | 48,000 | 120,000 | 36,000 | 72,000 | 180,000 |
| Transmission scanning electron microscope (JEM-2100F) | UT-010 | 1 days | 12,000 | 24,000 | 60,000 | 18,000 | 36,000 | 90,000 |
| High-contrast electron microscope for organic materials (Bio-TEM JEM-1400) | UT-011 | 1 days | 8,000 | 16,000 | 40,000 | 12,000 | 24,000 | 60,000 |
| Atomic Direct View Ultra-High Voltage Electron Microscope (JEM-ARM1250) | UT-401 | 1 days | 44,000 | 88,000 | 220,000 | 66,000 | 132,000 | 330,000 |
| Low damage scanning analytical electron microscope (JSM-7500FA) | UT-101 | 1 hours | 1,500 | 3,000 | 7,500 | 2,300 | 4,600 | 11,500 |
| High resolution scanning analytical electron microscope (JSM-7800F-PRIME) | UT-102 | 1 hours | 1,700 | 3,400 | 8,500 | 2,600 | 5,200 | 13,000 |
| High resolution scanning electron microscope (JSM-7000F (EBSD)) | UT-103 | 1 hours | 1,500 | 3,000 | 7,500 | 2,300 | 4,600 | 11,500 |
| Low vacuum scanning electron microscope (JSM-6510LA) | UT-104 | 1 hours | 1,000 | 2,000 | 5,000 | 1,500 | 3,000 | 7,500 |
| Focused ion/electron beam combined beam processing and observation device (JIB-PS500i) | UT-156 | 1 hours | 4,000 | 8,000 | 20,000 | 6,000 | 12,000 | 30,000 |
| Sample preparation device for electron microscope FIB XVision200TB (using FIB-SEM) | UT-152 | 1 hours | 4,000 | 8,000 | 20,000 | 6,000 | 12,000 | 30,000 |
| Cross section polisher (CP) cross section milling | UT-153 | 1 of | 3,000 | 6,000 | 15,000 | 4,500 | 9,000 | 22,500 |
| Cross-section polisher (CP) wide cross-section milling (room temperature) | UT-158 | 1 of | 6,700 | 13,400 | 33,500 | 10,050 | 20,100 | 50,250 |
| Cross section polisher (CP) plane milling | UT-158 | 1 of | 1,700 | 3,400 | 8,500 | 2,550 | 5,100 | 12,750 |
| Cross section polisher (CP) cooling cross section milling | UT-158 | 1 of | 5,400 | 10,800 | 27,000 | 8,100 | 16,200 | 40,500 |
| Ion slicer JEOL EM-09100IS | UT-154 | 1 days | 5,800 | 11,600 | 29,000 | 8,700 | 17,400 | 43,500 |
| Ion milling PIPSⅡ | UT-157 | 1 days | 6,500 | 13,000 | 32,500 | 9,750 | 19,500 | 48,750 |
| Ultramicrotome (UC7 type) | UT-403 | 1 days | 1,000 | 2,000 | 5,000 | 1,500 | 3,000 | 7,500 |
| Inorganic microcrystal structure analyzer (VariMax Dual) | UT-201 | 1 hours | 2,000 | 4,000 | 10,000 | 3,000 | 6,000 | 15,000 |
| High brightness In-plane type X-ray diffractometer (SmartLab (9kW)) | UT-202 | 0.5 days | 7,000 | 14,000 | 35,000 | 10,500 | 21,000 | 52,500 |
| Powder X-ray diffractometer (SmartLab (3kW)) | UT-203 | 0.5 days | 7,000 | 14,000 | 35,000 | 10,500 | 21,000 | 52,500 |
| Powder X-ray diffractometer (SmartLab (Kα1)) | UT-204 | 0.5 days | 7,000 | 14,000 | 35,000 | 10,500 | 21,000 | 52,500 |
| Multifunctional scanning X-ray photoelectron spectrometer XPS (PHI 5000) | UT-301 | 1 hours | 2,900 | 5,800 | 14,500 | 4,400 | 8,800 | 22,000 |
| Multifunctional scanning X-ray photoelectron spectrometer XPSwithAES (PHI 5000) VersaProbe III | UT-308 | 1 hours | 2,900 | 5,800 | 14,500 | 4,400 | 8,800 | 22,000 |
| Electron spin resonator (JES-FA300) | UT-302 | 1 days | 14,400 | 28,800 | 72,000 | 21,600 | 43,200 | 108,000 |
| Spectroscopic ellipsometer M-2000U (JAWoollam) | UT-303 | 1 days | 4,800 | 9,600 | 24,000 | 7,200 | 14,400 | 36,000 |
| PPMS Electromagnetic Property Measurement Device for Extreme Environments | UT-304 | 1 days | 19,200 | 38,400 | 96,000 | 28,800 | 57,600 | 144,000 |
| Environmental control manual prober station | UT-305 | 1 hours | 1,500 | 3,000 | 7,500 | 2,200 | 4,400 | 11,000 |
| Ultra trace element measurement system (NanoSIMS 50L) | UT-306 | 1 days | 64,000 | 128,000 | 320,000 | 96,000 | 192,000 | 480,000 |
| Ultra-trace element measurement system (NanoSIMS (preliminary analysis)) | UT-306 | 1 days | 10,000 | 20,000 | 50,000 | 10,000 | 20,000 | 50,000 |
| Special holder for STEM/TEM (sample cooling, sample heating, non-exposed to air, tomography) | - | 1 days | 5,000 | |||||
| XNUMXD analysis software usage fee (Amira, TEMography) | - | Time | 1,000 | |||||
| Glove box | - | 1 of | 5,000 | |||||
Revised on October 6, 4