WORKS
Actual introduction
WORKS
Actual introduction
Analysis case list
Focusing on transmission electron microscopes and scanning transmission analysis electron microscopes, we support material research through advanced nanomeasurements such as two-dimensional high-resolution secondary ion mass spectrometers (NanoSIMS), X-ray diffractometers, and physical property/electrical measurement devices. Offers.In transmission electron microscopes in particular, the University of Tokyo provides unique support to meet a wide range of needs, from atomic direct observation analysis to cryo observation.
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