WORKS

Analysis case list

Focusing on transmission electron microscopes and scanning transmission analysis electron microscopes, we support material research through advanced nanomeasurements such as two-dimensional high-resolution secondary ion mass spectrometers (NanoSIMS), X-ray diffractometers, and physical property/electrical measurement devices. Offers.In transmission electron microscopes in particular, the University of Tokyo provides unique support to meet a wide range of needs, from atomic direct observation analysis to cryo observation.