FACILITIES

Equipment guide

Sample preparation device

Cross section polisher (CP) cross section milling

Cross-section polisher (CP) wide cross-section milling (room temperature)

Cross section polisher (CP) plane milling

Cross section polisher (CP) cooling cross section milling

Ion slicer JEOL EM-09100IS

Ion milling PIPSⅡ

Ultramicrotome (UC7 type)

Ultramicrotome (UC7 type)

EM UC7 / Leica Biosystems

・Electrostatic pick-up method
・High visibility LED lighting system
・Stereomicroscope equipped with eucentric operation