FACILITIES

Equipment guide

Ultra-trace elemental analysis system

Ultra trace element measurement system (NanoSIMS 50L)

Ultra trace element measurement system (NanoSIMS 50L)

NanoSIMS 50L Made by Cameca

Primary ion species Cs+, O- (16 keV)
Minimum beam diameter Cs+ < 50 nm
O- < 200 nm
Mass spectrometer doubly convergent

High-resolution mapping of trace elements and isotopes and analysis of minute regions are possible.
It can detect 7 types of secondary ions at the same time.

Ultra-trace element measurement system (NanoSIMS (preliminary analysis))